1 INTRODUCTION

2 OBSERVATIONS AND DATA REDUCTION  
2.1 Instrumentation and Observations  
2.2 Data Reduction  

3 PRODUCTION OF POINT-SOURCE CATALOGS  
3.1 Image and Exposure Map Creation  
3.2 Point-Source Searching and Catalog Production  
3.3 Background and Sensitivity Analysis  

4 MULTI WAVELENGTH PROPERTIES OF MAIN CATALOG SOURCES

5 THE EXTENDED X-RAY SOURCE J221744.6+001738

6 SUMMARY